3

Atomic diffusion at the Cu–Au–Si multilayers interface

Year:
2005
Language:
english
File:
PDF, 216 KB
english, 2005
8

Electrical properties of Cr/Si(p) structures

Year:
1999
Language:
english
File:
PDF, 413 KB
english, 1999
9

Effect of implanted phosphorus on silicide formation in the Cr/Si(111) system

Year:
2001
Language:
english
File:
PDF, 139 KB
english, 2001
10

Behaviour of copper atoms in annealed Cu/SiOx/Si systems

Year:
2000
Language:
english
File:
PDF, 471 KB
english, 2000
15

Field Electron Emission of MWCNTs/PEO Composites

Year:
2013
Language:
english
File:
PDF, 346 KB
english, 2013